Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-03-06
2007-03-06
Tu, Christine T. (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S731000
Reexamination Certificate
active
10882523
ABSTRACT:
In one embodiment, an apparatus includes a datapath circuit to generate a data output signal in response to a data input signal and at least a first data clock signal; a shadow circuit, coupled to the datapath circuit, to generate a shadow output signal in response the data input signal and at least a second data clock signal during a functional mode of operation and to generate a scan-out signal in response to a scan-in signal and at least a first test clock signal during a test mode of operation; and an error detect circuit, coupled to the datapath and the shadow circuits, to generate an error signal in response to a mismatch between the data output signal and the shadow output signal.
REFERENCES:
patent: 6023778 (2000-02-01), Li
patent: 6029261 (2000-02-01), Hartmann
patent: 6708284 (2004-03-01), Smith
patent: 6735731 (2004-05-01), Ewen et al.
patent: 2003/0046643 (2003-03-01), Ohta
patent: 2003/0222677 (2003-12-01), Komaki
patent: 2004/0041610 (2004-03-01), Kundu
patent: 2004/0243893 (2004-12-01), Mudge et al.
Goteti Prashant M.
Kim Kee S.
Mak Tak M.
Mitra Subhasish
Intel Corporation
Schwabe Williamson & Wyatt P.C.
Tu Christine T.
LandOfFree
Error detecting circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Error detecting circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Error detecting circuit will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3742614