Device testing

Details Device testing Device testing

2005-04-26

2005-04-26

Deb, Anjan (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C375S219000, C375S226000, C375S376000

Reexamination Certificate

active

06885209

ABSTRACT:
A testing mode is provided for self testing of the transmitter and receiver pair provided on-chip. The testing mode targets each module individually; wherein when one of the two devices is placed under test, the other is used as a tester. When the transmitter is the device under test and the receiver is the tester that receives a transmitted signal from the transmitter, the receiver is used to determine the data eye size with the transmitted signal. When the receiver is the device under test and the transmitter is the tester, the transmitter is used to determine the amount of noise and power loss tolerated by the receiver.

REFERENCES:
patent: 4809306 (1989-02-01), Somer
patent: 6331999 (2001-12-01), Ducaroir et al.

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