Functional testing of logic circuits that use high-speed links

Details Functional testing of logic circuits that use high-speed links Functional testing of logic circuits that use high-speed links

2005-12-13

2005-12-13

Wachsman, Hal (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S117000, C702S119000, C702S123000, C714S718000, C714S724000

Reexamination Certificate

active

06975954

ABSTRACT:
A method of testing a DUT is provided. The method comprises loading a memory within a link-based system with a functional test program, executing the functional test program in a processor core of the link-based system, and routing test signals generated during execution of the functional test program to a response agent embedded in the link-based system via an external path.

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