4. Thermal measuring and testing
  5. Temperature measurement
  6. Nonelectrical, nonmagnetic, or nonmechanical temperature...

Tae-Min Eom

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Forming composite metal oxide layer with hafnium oxide and...

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
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Method and apparatus for detecting contaminants in...

Thermal measuring and testing – Temperature measurement – Nonelectrical – nonmagnetic – or nonmechanical temperature...
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Method and apparatus for inspecting a wafer surface

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Method and apparatus for measuring contamination of a...

Semiconductor device manufacturing: process – Including control responsive to sensed condition
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Method of inspecting a leakage current characteristic of a...

Metal working – Barrier layer or semiconductor device making
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Profile ID: LFUS-PAI-P-2816375

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