4. Excavating

Sumit DasGupta

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Chip partitioning aid (CPA)-A structure for test pattern generat

Electricity: measuring and testing – Plural – automatically sequential tests
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Complete chip I/O test through low contact testing using enhance

Excavating
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High speed binary counter

Electrical pulse counters – pulse dividers – or shift registers: c – Systems – Using particular code or particular counting sequence
Patent

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Interrupt mechanism for multiprocessing system having a pluralit

Boots – shoes – and leggings
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Level sensitive scan design (LSSD) system

Boots – shoes – and leggings
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