4. Scanning-probe techniques or apparatus; applications of scanning
  5. Particular type of scanning probe microscopy or microscope;...
  6. Scanning tunnelling microscopy or apparatus therefor, e.g.,...

SII NanoTechnology Inc.

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Analysis apparatus and analysis method

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
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Apparatus and method for measuring thickness and composition...

X-ray or gamma ray systems or devices – Specific application – Fluorescence
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Apparatus for processing and observing a sample

Radiant energy – Inspection of solids or liquids by charged particles – Electron microscope type
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Apparatus structure and scanning probe microscope including...

Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;... – Scanning tunnelling microscopy or apparatus therefor – e.g.,...
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Atom probe apparatus and method for working sample...

Radiant energy – Inspection of solids or liquids by charged particles
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Profile ID: LFUS-PAI-P-2162475

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