4. Excavating

Sandip Kundu

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Adjustable weighted random test pattern generator for logic circ

Excavating
Patent

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CMOS transistor network to gate level model extractor for simula

Boots – shoes – and leggings
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Constrained signature-based test

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Dft technique for avoiding contention/conflict in logic...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Generalized fault model for defects and circuit marginalities

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-620919

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