Generalized fault model for defects and circuit marginalities

Details Generalized fault model for defects and circuit marginalities Generalized fault model for defects and circuit marginalities

2006-04-25

2006-04-25

Decady, Albert (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S033000, C714S037000, C714S745000

Reexamination Certificate

active

07036063

ABSTRACT:
A generalized fault model. For one aspect, extracted faults may be modeled using a fault model in which at least one of the following is specified: multiple fault atoms, two or more impact conditions for a first set of excitation conditions, a relative priority of fault atoms within a set of fault atoms used to model the at least one extracted fault, a dynamic fault delay, and excitation conditions including at least a first mandatory excitation condition and at least a second optional excitation condition.

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