Adjustable weighted random test pattern generator for logic circ

Details Adjustable weighted random test pattern generator for logic circ Adjustable weighted random test pattern generator for logic circ

1992-06-17

1994-03-22

Canney, Vincent P.

Excavating

371 221, G01R 3128

Patent

active

052971511

ABSTRACT:
A test pattern generator includes a random pattern generator and a shift register. The random pattern generator generates a series of digits which are input to the shift register and stored therein. Each digit output by the random pattern generator has a probability of having a first value, such as representing "1". The output probability of the random pattern generator is adjustable. The shift register has a plurality of outputs for outputting a test pattern comprising the stored digits. The shift register includes a series of latches and at least a first logic circuit connecting the output of the random pattern generator to the input of a first latch, or connecting the output of a latch to the input of a next adjacent latch. In a first state, the logic circuit has an output probability which is independent of the output probability of the random pattern generator. In a second state, the logic circuit has an output probability which is dependent on the output probability of the random pattern generator.

REFERENCES:
patent: 4817093 (1989-03-01), Jacobs et al.
patent: 5043988 (1991-08-01), Brglez et al.
J. A. Waicukauski et al. "A method for generating weighted random test patterns." IBM Journal of Research and Development. vol. 33, pp. 149-161, Mar. 1989.
B. Koenemann. "Application of STAGE for Biased Random Pattern Testing." May 1991.
S. F. Dennis et al. "Test Generation Using an Efficient Weight Generator." IBM Technical Disclosure Bulletin. Vol. 32, pp. 429-433, Sep. 1989.
B. Koenemann. "Biased Random Pattern Test Generation." IBM Technical Disclosure Bulletin. vol. 33, pp. 411-412, Jul. 1990.
F. Muradali et al. "A New Procedure For Weighted Random Built-In Self-Test." IEEE Proceedings International Test Conference. Pp. 660-669, Sep. 1990.

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