4. Semiconductor device manufacturing: process
  5. Making device or circuit emissive of nonelectrical signal
  6. Including integrally formed optical element

Peilin Song

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AC scan diagnostic method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Angular spectrum tailoring in solid immersion microscopy for...

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Angular spectrum tailoring in solid immersion microscopy for...

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Apparatus and methods for packaging electronic devices for...

Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Electromagnetic or particle radiation
Reexamination Certificate

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Apparatus and methods for packaging electronic devices for...

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Including integrally formed optical element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2232228

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