4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Memory testing

Norikatsu Takaura

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Hybrid semiconductor device having an n+ (p) doped n-type...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Integrated circuit device with P-type gate memory cell...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Memory device

Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate

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Non-volatile memory device and method of manufacturing the same

Semiconductor device manufacturing: process – Making passive device
Reexamination Certificate

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Phase change memory and phase change recording medium

Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2229729

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