Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2004-12-20
2010-11-16
Pham, Thanh V (Department: 2894)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257S042000, C257SE27004, C257SE45002, C365S148000, C365S046000
Reexamination Certificate
active
07834337
ABSTRACT:
A phase-change memory device including a memory cell having a memory element and a select transistor is improved in heat resistance so that it may be operable at 145° C. or higher.The memory layer is used which has a content of Zn or Cd of 20 at % or more and 50 at % or less, a content of Ge or Sb of 5 at % or more and 25 at % or less, and a content of Te of 40 at % or more and 65 at % or less in Zn-Ge-Te.
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Kurotsuchi Kenzo
Matsuoka Hideyuki
Takaura Norikatsu
Terao Motoyasu
Laurenzi, III Mark A
Miles & Stockbridge P.C.
Pham Thanh V
Renesas Electronics Corporation
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