4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Nazmul Habib

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Array-based early threshold voltage recovery...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Methods, apparatus, and program products to optimize...

Data processing: financial – business practice – management – or co – For cost/price
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Multicore processor having storage for core-specific...

Electrical computers and digital data processing systems: input/ – Input/output data processing – Peripheral adapting
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Parametric-based semiconductor design

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Testing method using a scalable parametric measurement macro

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Profile ID: LFUS-PAI-P-2190936

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