Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-12-15
2009-02-03
Kik, Phallaka (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C703S016000
Reexamination Certificate
active
07487477
ABSTRACT:
A parametric-based design methodology interlocks the design of library elements used in a semiconductor product design with the testing protocol used for the resulting semiconductor products such that parametric assumptions made regarding library elements used in a semiconductor product design may be used to disposition products such as semiconductor chips incorporating a semiconductor product design. In particular, a parametric measurement element is incorporated into a product design along with one or more library elements, with the parametric measurement element used to test one or more parametric design points that are associated with the library elements when the product design is used in a manufactured product.
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Bickford Jeanne Paulette Spence
Goss John Robert
Habib Nazmul
McMahon Robert J.
International Business Machines - Corporation
Kik Phallaka
Wood Herron & Evans LLP
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