Parametric-based semiconductor design

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000, C716S030000, C703S016000

Reexamination Certificate

active

07487477

ABSTRACT:
A parametric-based design methodology interlocks the design of library elements used in a semiconductor product design with the testing protocol used for the resulting semiconductor products such that parametric assumptions made regarding library elements used in a semiconductor product design may be used to disposition products such as semiconductor chips incorporating a semiconductor product design. In particular, a parametric measurement element is incorporated into a product design along with one or more library elements, with the parametric measurement element used to test one or more parametric design points that are associated with the library elements when the product design is used in a manufactured product.

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