Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-01-11
2011-01-11
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S762010, C324S763010
Reexamination Certificate
active
07868640
ABSTRACT:
A method and test circuit provide measurements to aid in the understanding of time-varying threshold voltage changes such as negative bias temperature instability and positive bias temperature instability. In order to provide accurate measurements during an early stage in the threshold variation, a current generating circuit is integrated on a substrate with the device under test, which may be a device selected from among an array of devices. The current generating circuit may be a current mirror that responds to an externally-supplied current provided by a test system. A voltage source circuit may be included to hold the drain-source voltage of the transistor constant, although not required. A stress is applied prior to the measurement phase, which may include a controllable relaxation period after the stress is removed.
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Agarwal Kanak B
Habib Nazmul
Hayes Jerry D.
Massey John Greg
Strong Alvin W.
Harris Andrew M.
International Business Machines - Corporation
Mitch Harris Atty at Law, LLC
Nguyen Ha Tran T
Toub Libby Z.
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