Methods, apparatus, and program products to optimize...

Data processing: financial – business practice – management – or co – For cost/price

Reexamination Certificate

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C716S030000, C716S030000

Reexamination Certificate

active

07917451

ABSTRACT:
An apparatus, method, and program product are provided to predict yield loss associated with performance screens or leakage screens. A leakage model is correlated to an on-chip measurement. Current limited yields are determined from the leakage model. A database is formed relating performance sigma cut-points to the circuit limited yields. A product is quoted based on the circuit limited yield for one of the performance sigma cut-points taken from the database. The quote is tied to the product design and testing.

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patent: 7139671 (2006-11-01), Satake
patent: 7305278 (2007-12-01), Enright et al.
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patent: 2004/0263365 (2004-12-01), Robinson et al.
patent: 2006/0025956 (2006-02-01), Satake
patent: 2008/0009959 (2008-01-01), Enright et al.
patent: 2009/0070716 (2009-03-01), Joshi et al.
patent: 2009/0234777 (2009-09-01), Barnett et al.

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