Error detection/correction and fault detection/recovery
Pulse or data error handling
Replacement of memory spare location, portion, or segment
Inventor
active
BISR mode to test the redundant elements and regular...
Method and system for performing built-in self-test routines...
Method and system for performing built-in-self-test routines...
Method for testing semiconductor devices having built-in...
Power-on state machine implementation with a counter to...
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