BISR mode to test the redundant elements and regular...

Details BISR mode to test the redundant elements and regular... BISR mode to test the redundant elements and regular...

2011-03-22

2011-03-22

Beausoliel, Robert (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Replacement of memory spare location, portion, or segment

C714S703000

Reexamination Certificate

active

07913125

ABSTRACT:
A BISR mode and associated method for testing memory. All redundant elements of the memory including the ones which are not used are tested, and interaction between redundant elements of the memory and adjacent functional memory are checked. Repair information is used to repair the memory. In addition, redundant elements which are not needed to be used for repairing the memory are forced to be used, such as by faking defects to remap good elements with redundant elements.

REFERENCES:
patent: 5835431 (1998-11-01), Miner et al.
patent: 5841709 (1998-11-01), McClure
patent: 6640321 (2003-10-01), Huang et al.
patent: 6661719 (2003-12-01), Shih et al.
patent: 6961880 (2005-11-01), Frankowsky
patent: 6999357 (2006-02-01), Tanishima et al.
patent: 2003/0237061 (2003-12-01), Miller et al.

Affiliated with

Also associated with

Rating

BISR mode to test the redundant elements and regular... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with BISR mode to test the redundant elements and regular..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and BISR mode to test the redundant elements and regular... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2773823