4. Excavating

Michael L. Combs

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Method and apparatus for reduced pin count package...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Method and apparatus for reduced pin count package...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Parametric testing for high pin count ASIC

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Per-pin integrated circuit test system having n-bit interface

Excavating
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Testing and repair methodology for memories having redundancy

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1720051

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