4. Cleaning and liquid contact with solids
  5. Processes
  6. Including application of electrical radiant or wave energy...

Matthew S. Ryskoski

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Method and apparatus for classifying faults based on wafer...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate

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Method and apparatus for comparing device and non-device...

Semiconductor device manufacturing: process – Including control responsive to sensed condition
Reexamination Certificate

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Method and apparatus for determining control actions based...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

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Method and apparatus for determining wafer quality profiles

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Reexamination Certificate

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Method and apparatus for dynamic adjustment of an active...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
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Profile ID: LFUS-PAI-P-2439691

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