4. Semiconductor device manufacturing: process
  5. With measuring or testing

Manu Rehani

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Adaptive off tester screening method based on intrinsic die...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Heaviest only fail potential

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
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Method to selectively identify at risk die based on location...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Method to selectively identify reliability risk die based on...

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Method to selectively identify reliability risk die based on...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2421220

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