Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
Inventor
active
Bipolar transistor produced using processes compatible with...
Electrically erasable and programmable non-volatile memory cell
Method and relative test structure for measuring the...
Method and relative test structure for measuring the...
Multi-emitter bipolar transistor for bandgap reference circuits
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Profile ID: LFUS-PAI-P-2373709