Method and relative test structure for measuring the...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

07352192

ABSTRACT:
A method and a relative test structure for measuring the coupling capacitance between two interconnect lines exploits the so-called cross-talk effect and keeps an interconnect line at a constant reference voltage. This approach addresses the problem of short-circuit currents that affect known test structures, and allows a direct measurement of the coupling capacitance between the two interconnect lines. Capacitance measurements may also be used for determining points of interruption of interconnect lines. When a line is interrupted, the measured coupling capacitance is the capacitance of a single conducting branch. The position of points of interruption of an interconnect line is determined by measuring the coupling capacitance of all segments of the line with a second conducting line.

REFERENCES:
patent: 5095750 (1992-03-01), Suzuki et al.
patent: 5641911 (1997-06-01), Ryhanen
patent: 6366098 (2002-04-01), Froment
patent: 6856143 (2005-02-01), McNutt et al.
patent: 6934669 (2005-08-01), Suaya et al.
patent: 2002/0116696 (2002-08-01), Suaya et al.
patent: 2005/0024077 (2005-02-01), Huang et al.
Kühn et al., “Interconnect Capacitances, Crosstalk, and Signal Delay in Vertically Integrated Circuits”, Siemens AG, Institute for Integrated Circuits & Fraunhofer Institute for Solid State Technology, München, Germany, © 1995 IEEE, pp. 10.3.1 to 10.3.4, month unavailable.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and relative test structure for measuring the... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and relative test structure for measuring the..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and relative test structure for measuring the... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2763906

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.