Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Inventor
active
Built-in current sensor for IDDQ monitoring
Built-in self test for multiple memories in a chip
Intermediate voltage sensor for CMOS circuits
Multi-project system-on-chip and its method
Test method and architecture for circuits having inputs
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Profile ID: LFUS-PAI-P-200465