Built-in current sensor for IDDQ monitoring

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

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G01R 3126

Patent

active

058084762

ABSTRACT:
An apparatus for measuring the current of a CMOS circuit includes a reference current generator to generate a reference current, a first current mirror to mirror the reference current, a second current mirror to mirror the current consumed by the CMOS circuit, an inverter to compare the above two mirrored currents and generate a signal to indicate which current is larger, and a multiplexer to switch between the normal circuit operation mode and the test mode. By this apparatus, it is possible to measure rapidly and accurately whether the CMOS circuit consumes an abnormally large current, thereby determining whether the CMOS circuit contains defects. This apparatus is based on the current-mode approach, hence can provide a high speed signal processing capability and has lower sensitivity to parameter deviation caused by process or operating temperature variations. It also provides scaleable sensing resolutions and programmable current reference.

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