4. Static information storage and retrieval
  5. Read/write circuit
  6. Bad bit

Kazuo Nakaizumi

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Apparatus for testing semicondctor wafer

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Apparatus for testing semiconductor wafer

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Compound semiconductor memory device having redundant circuit co

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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D-FF circuit

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Particular stable state circuit
Reexamination Certificate

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D-FF circuit

Electronic digital logic circuitry – Clocking or synchronizing of logic stages or gates – Field-effect transistor
Reexamination Certificate

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Profile ID: LFUS-PAI-P-137840

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