4. Radiant energy
  5. Inspection of solids or liquids by charged particles
  6. Electron probe type

Kam-Leung Lee

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Elevated source drain disposable spacer CMOS

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate

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Elevated source drain disposable spacer CMOS

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate

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Inspection system utilizing retarding field back scattered elect

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
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Laser processing method for trench-edge-defect-free solid...

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Amorphous semiconductor
Reexamination Certificate

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Method for slowing down dopant-enhanced diffusion in...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate

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Profile ID: LFUS-PAI-P-843616

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