Active solid-state devices (e.g., transistors, solid-state diode
Including region containing crystal damage
Inventor
active
Defect gettering by induced stress
Defect gettering by induced stress
Double epitaxial method of fabricating semiconductor devices on
Method of fabricating back diffused bonded oxide substrates
Ultra-thin circuit fabrication by controlled wafer debonding
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Profile ID: LFUS-PAI-P-1071078