4. Electricity: electrical systems and devices
  5. Safety and protection of systems and devices
  6. Circuit interruption by thermal sensing

Jon Robert Tetzloff

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Electrical open/short contact alignment structure for active...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Electrical open/short contact alignment structure for active...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Electrical open/short contact alignment structure for active...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Enhanced speed sorting of microprocessors at wafer test

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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FinFET body contact structure

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2429309

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