Enhanced speed sorting of microprocessors at wafer test

Details Enhanced speed sorting of microprocessors at wafer test Enhanced speed sorting of microprocessors at wafer test

2008-06-05

2011-11-01

Velez, Roberto (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S762050

Reexamination Certificate

active

08049526

ABSTRACT:
A method and apparatus are provided for implementing optimized speed sorting of microprocessors at wafer test. A combination of speed-predicting metrics are measured early in the manufacturing process and are applied to a unique algorithm to properly sort parts into appropriate speed bins. The method significantly improves the accuracy of predicting the chip speed over conventional speed-predicting methods.

REFERENCES:
patent: 6459293 (2002-10-01), Keshavarzi et al.
patent: 6625758 (2003-09-01), Singh

Affiliated with

Also associated with

Rating

Enhanced speed sorting of microprocessors at wafer test does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Enhanced speed sorting of microprocessors at wafer test, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Enhanced speed sorting of microprocessors at wafer test will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4274140