Joe W. McPherson

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Dual ramp rate dielectric breakdown testing methodology

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Integrated circuit using a back gate voltage for burn-in operati

Semiconductor device manufacturing: process – Including control responsive to sensed condition – Electrical characteristic sensed
Patent

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Line-to-line reliability enhancement using a dielectric...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Line-to-line reliability enhancement using a dielectric...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Method and apparatus for protecting gate oxide from process-indu

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Patent

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Profile ID: LFUS-PAI-P-640091

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