4. Static information storage and retrieval
  5. Read/write circuit
  6. Bad bit

Jochen Kallscheuer

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Integrated semiconductor memory

Static information storage and retrieval – Addressing – Plural blocks or banks
Reexamination Certificate

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Method for on-chip testing of memory cells of an integrated...

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Method for testing semiconductor chips

Semiconductor device manufacturing: process – With measuring or testing
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Method for testing semiconductor chips by means of bit masks

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for testing semiconductor chips using register sets

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Profile ID: LFUS-PAI-P-2706336

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