Static information storage and retrieval – Addressing – Plural blocks or banks
Reexamination Certificate
2007-10-16
2007-10-16
Lam, David (Department: 2827)
Static information storage and retrieval
Addressing
Plural blocks or banks
C365S230080, C365S189120
Reexamination Certificate
active
11414554
ABSTRACT:
An integrated semiconductor memory device includes a first memory zone, a second memory zone, first address connections and a second address connection. A second address signal present at the second address connection specifies the access to the first or second memory zone, whereas it is specified via first address signals at the first address connections which memory cell is accessed within the first or second memory zone. In a first memory configuration, all address connections are driven externally with address signals and the access to a memory cell in the first or second memory zone is controlled. In a second memory configuration, only the first address connections are driven externally whereas a signaling bit in a mode register regulates the access to the first or second memory zone. This provides for access to the second memory zone even if there is no possibility of externally driving the second address connection.
REFERENCES:
patent: 5032981 (1991-07-01), Bril et al.
patent: 5848431 (1998-12-01), Pawlowski
patent: 6064619 (2000-05-01), Ahn et al.
patent: 6404696 (2002-06-01), Oowaki
ST Microelectronics, “PSDsoft Express and PSD4235 Design Guide Rev 0.1 11.01”,ST Microelectronics Application Note, An 1356, Sep. 2001, pp. 3-49.
Funfrock Fabien
Kallscheuer Jochen
Sommer Michael Bernhard
Stocken Christian
Edell Shapiro & Finnan LLC
Infineon - Technologies AG
Lam David
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