Method for testing semiconductor chips

Details Method for testing semiconductor chips Method for testing semiconductor chips

2005-02-22

2005-02-22

Smith, Matthew (Department: 2825)

Semiconductor device manufacturing: process

With measuring or testing

C438S149000, C438S199000, C438S200000, C438S201000, C438S015000, C438S286000, C438S290000, C716S030000, C714S718000, C714S719000, C714S721000, C714S724000, C714S733000, C714S734000, C714S735000

Reexamination Certificate

active

06858447

ABSTRACT:
A method for testing semiconductor chips, in particular semiconductor memory chips, is described. In which, in a chip to be tested, at least one test mode is set, the test mode is executed in the chip and test results are output from the chip. It is provided that, after the setting and before the performance of the test mode, a check mode is executed in which the status of the test mode set in the chip is read out in a defined format.

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patent: 5644699 (1997-07-01), Yoshida
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patent: 6259639 (2001-07-01), Hashizume
patent: 6314011 (2001-11-01), Keeth et al.
patent: 6557128 (2003-04-01), Turnquist
patent: 0 786 675 (1997-04-01), None

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