4. Semiconductor device manufacturing: process
  5. Making field effect device having pair of active regions...
  6. On insulating substrate or layer

Jianq Chyun IP office

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Auto-recovery wafer testing apparatus and wafer testing method

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Control chip for accelerating memory access and method of...

Electrical computers and digital processing systems: memory – Storage accessing and control – Access timing
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Electrically erasable programmable read only memory cell and...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
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Flash memory structure and operating method thereof

Static information storage and retrieval – Floating gate – Particular biasing
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Handheld electronic device

Telecommunications – Transmitter and receiver at same station – Radiotelephone equipment detail
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Profile ID: LFUS-PAI-P-2808072

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