Auto-recovery wafer testing apparatus and wafer testing method

Details Auto-recovery wafer testing apparatus and wafer testing method Auto-recovery wafer testing apparatus and wafer testing method

2005-11-08

2005-11-08

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

06963213

ABSTRACT:
Auto-recovery wafer testing apparatus and wafer testing method are provided. The wafer testing apparatus includes a main system, a tester and a real-time accessing module. The main system controls the process of the wafer testing. The tester is electrically coupled to the main system for receiving commands from the main system to perform testing on a plurality of chips sequentially and output the testing data correspondingly. The real-time accessing module is electrically coupled to the tester for simultaneously accessing the testing data. In an event when the testing is accidentally interrupted, the tester can produce auto-recovery data according to the testing data saved in the real-time accessing module, and continue testing, based on the auto-recovery data, from the chip being last but incompletely tested. The use of the wafer testing apparatus and method can save testing time and enhance the production efficiency.

REFERENCES:
patent: 6687315 (2004-02-01), Keevill et al.
patent: 6745345 (2004-06-01), Cabezas et al.

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