4. Semiconductor device manufacturing: process
  5. Coating of substrate containing semiconductor region or of...
  6. Insulative material deposited upon semiconductive substrate

Jianing Sun

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Ellipsometric investigation and analysis of textured samples

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Plasma detemplating and silanol capping of porous dielectric...

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Combined with the removal of material by nonchemical means
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VLSI fabrication processes for introducing pores into...

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
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VLSI fabrication processes for introducing pores into...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
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VLSI fabrication processes for introducing pores into...

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Total dielectric isolation
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Profile ID: LFUS-PAI-P-2338027

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