4. Semiconductor device manufacturing: process
  5. Coating with electrically or thermally conductive material
  6. To form ohmic contact to semiconductive material

James A. Bruce

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Adhesion characterization test site

Measuring and testing – Coating material: ink adhesive and/or plastic
Patent

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Design verification

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Electrical test structure and method for space and line measurem

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Fluorine-containing base layer for multi-layer resist processes

Radiation imagery chemistry: process – composition – or product th – Imaged product – Multilayer
Patent

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Illumination tailoring system using photochromic filter

Photocopying – Projection printing and copying cameras – Illumination systems or details
Patent

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Profile ID: LFUS-PAI-P-792445

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