4. Thermal measuring and testing
  5. Thermal calibration system

Jae-Won Han

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Deposition stop time detection apparatus and methods for...

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate

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Manufacturing method of semiconductor device

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – Insulated gate formation
Reexamination Certificate

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Metal line stacking structure in semiconductor device and...

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate

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Method for calibrating optical sensor used to measure the temper

Thermal measuring and testing – Thermal calibration system
Patent

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Method for manufacturing silicide and semiconductor with the...

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Metallic housing or support
Reexamination Certificate

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Profile ID: LFUS-PAI-P-689645

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