4. Semiconductor device manufacturing: process
  5. Making field effect device having pair of active regions...
  6. Having insulated gate

Infineon - Technologies AG

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1 T flash memory recovery scheme for over-erasure

Static information storage and retrieval – Floating gate – Particular biasing
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2T2C signal margin test mode using a defined charge and...

Static information storage and retrieval – Read/write circuit – Testing
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2T2C signal margin test mode using a defined charge exchange...

Static information storage and retrieval – Read/write circuit – Testing
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2T2C signal margin test mode using resistive element

Static information storage and retrieval – Read/write circuit – Testing
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5V compliant transmission gate and the drive logic using...

Electronic digital logic circuitry – Interface – Supply voltage level shifting
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