4. Electricity: measuring and testing
  5. Impedance, admittance or other quantities representative of...
  6. Parameter related to the reproduction or fidelity of a...

Glenn A. Biery

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Dual channel d.c. low noise measurement system and test methodol

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent

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Dual channel D.C. low noise measurement system and test methodol

Electric heating – Heating devices – Combined with container – enclosure – or support for material...
Patent

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Dual damascene interconnect structure using low stress...

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate

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Formation of fully silicided (FUSI) gate using a dual...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate

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Method of making self-aligned, lateral diffusion barrier in meta

Fishing – trapping – and vermin destroying
Patent

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Profile ID: LFUS-PAI-P-137904

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