4. Error detection/correction and fault detection/recovery
  5. Data processing system error or fault handling
  6. Reliability and availability

Eugene E. Prouix

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Boundary scan with strobed pad driver enable

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Circuit and method for adding parametric test capability to...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit and method for measuring delay of high speed signals

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Frequency of cyclic current or voltage
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Circuit and method for measuring jitter of high speed signals

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
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Clock controller for at-speed testing of scan circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Profile ID: LFUS-PAI-P-2884518

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