Circuit and method for measuring jitter of high speed signals

Details Circuit and method for measuring jitter of high speed signals Circuit and method for measuring jitter of high speed signals

2007-01-02

2007-01-02

Wachsman, Hal (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S075000, C702S079000, C702S179000, C375S225000, C375S226000

Reexamination Certificate

active

10947189

ABSTRACT:
A method and circuit for measuring a statistical value of jitter for a data signal having a data rate fD, comprises digitally sampling the data signal at a sampling rate, fS, to produce sampled logic values, where fD/fSis a predetermined non-integer ratio; and analyzing the sampled values to deduce a statistical value of the jitter.

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