4. Optics: measuring and testing
  5. Inspection of flaws or impurities

Darrell L. Miles

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Angular spectrum tailoring in solid immersion microscopy for...

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Angular spectrum tailoring in solid immersion microscopy for...

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Apparatus and method for single die backside probing of...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Backside integrated circuit die surface finishing technique...

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate

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Backside integrated circuit die surface finishing technique...

Abrading – Abrading process – Glass or stone abrading
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2263228

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