4. Semiconductor device manufacturing: process
  5. Coating with electrically or thermally conductive material
  6. To form ohmic contact to semiconductive material

Conal Eugene Murray

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Control of liner thickness for improving thermal cycle...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Control of liner thickness for improving thermal cycle...

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Method and structure for determining thermal cycle reliability

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate

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Method of extracting properties of back end of line (BEOL)...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Modified via bottom structure for reliability enhancement

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2394227

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