Method of extracting properties of back end of line (BEOL)...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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Details

C716S030000, C716S030000, C430S005000

Reexamination Certificate

active

10687475

ABSTRACT:
A method for analyzing circuit designs includes discretizing a design representation into pixel elements representative of a structure in the design and determining at least one property for each pixel element representing a portion of the design. Then, a response of the design is determined due to local properties across the design.

REFERENCES:
patent: 5172420 (1992-12-01), Ray et al.
patent: 6072608 (2000-06-01), Psaltis et al.
patent: 6353801 (2002-03-01), Sercu et al.
patent: 6367053 (2002-04-01), Belk et al.
patent: 6601025 (2003-07-01), Ditlow et al.
patent: 6629292 (2003-09-01), Corson et al.
patent: 6681376 (2004-01-01), Balasinski et al.
patent: 6766261 (2004-07-01), Nishino et al.
patent: 6907583 (2005-06-01), Abt et al.
patent: 2003/0103150 (2003-06-01), Catrysse et al.
patent: 2005/0066301 (2005-03-01), Lorenz et al.
patent: 2006/0094046 (2006-05-01), Abo et al.
Brankovic et al., “An improved FD-TD full wave analysis for arbitrary guiding structures using a two-dimensional mesh”, Jun. 5, 1992, Microwave Symposium Digest, 1992., IEEE MTT-S International,pp. 389-392 vol. 1 □□.
Bagnoli et al., Fast analytical thermal modeling of electronic devices and circuits with multi-layer stack mountings, Dec. 10-12, 2003, Electronics Packaging Technology, 2003 5th Conference (EPTC 2003), pp. 501-506.

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