4. Optics: measuring and testing
  5. By polarized light examination
  6. With light attenuation

Chris L. Koliopoulos

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Compliant pad wafer chuck

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Method, system, and software for evaluating characteristics...

Data processing: measuring – calibrating – or testing – Measurement system – Dimensional determination
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Method, system, and software for evaluating characteristics...

Data processing: measuring – calibrating – or testing – Measurement system – Dimensional determination
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Sheet flatness measurement system and method

Optics: measuring and testing – By polarized light examination – With light attenuation
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System and method for controlling a beam source in a...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Profile ID: LFUS-PAI-P-1797953

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