Chandramouli Visweswariah

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Affinity-based clustering of vectors for partitioning the...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
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Chip design and fabrication method optimized for profit

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Optimization
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IC chip at-functional-speed testing with process coverage...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Method and apparatus for computing test margins for at-speed...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Method and apparatus for covering a multilayer process space...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Profile ID: LFUS-PAI-P-1032417

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