Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2011-06-28
2011-06-28
Ton, David (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C703S014000
Reexamination Certificate
active
07971120
ABSTRACT:
In one embodiment, the invention is a method and apparatus covering a multilayer process space during at-speed testing. One embodiment of a method for selecting a set of paths with which to test a process space includes determining a number N of paths to be included in the set of paths such that at least number M of paths in N for which testing of the process space will fail, computing a metric that substantially ensures that the set of paths satisfies the requirements of N and M, and outputting the metric for use in selecting the set of paths.
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Shi Yiyu
Visweswariah Chandramouli
Xiong Jinjun
Zolotov Vladimir
International Business Machines - Corporation
Ton David
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