Timing failure remedying apparatus for an integrated...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Details

C714S718000, C714S733000, C714S738000, C714S744000

Reexamination Certificate

active

07603600

ABSTRACT:
A timing failure remedying apparatus for an integrated circuit has a comparator which compares a value captured in a taking-out scan chain for reference through an operation of a processing core for reference according to a first clock signal with a value captured in a taking-out scan chain to be tested through an operation of a processing core to be tested according to a second clock signal, a diagnosing unit which determines a timing failure in the logic circuit to be tested on the basis of a result of comparison by the comparator, and an adjuster which adjusts at least either a second cycle or a delay amount of the second clock signal. It is possible to examine a position of the timing failure or the number of the timing failures in the integrated circuit diagnosed as that its logic is normal but the timing failure occurs therein.

REFERENCES:
patent: 6671842 (2003-12-01), Phan et al.
patent: 6964002 (2005-11-01), Lurkins
patent: 7290186 (2007-10-01), Zorian et al.
patent: 7539598 (2009-05-01), Jang et al.
patent: 2007/0186132 (2007-08-01), Dingemanse
patent: 2008/0010573 (2008-01-01), Sul
patent: 2001-43261 (2001-02-01), None
patent: 2003-4807 (2003-01-01), None

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